C METER
Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lin
- High-speed analog test time of 0.6 ms (at 1 MHz)
- 1 kHz and 1 MHz measurement frequency supports stable low capacitance
- BIN function, for easy component screening
- 제조사
- HIOKI
- 제품명
- C METER
- 제품번호
- 3506-10
● High-speed analog test time of 0.6 ms (at 1 MHz)
● 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
● Improved noise resistance and enhanced repeatability in measurement precision even for production lines
● BIN function, for easy component screening
