• 1 MHz to 3 GHz testing source frequency

• Fastest test speed of 0.5 msec (Analog measurement time)

• 0.07% measured value variability (when measuring at 1GHz)

• ±0.65% rdg. basic accuracy

• Compact, half-rack footprint with space-saving test head

• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)

• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode